Tradeoffs between gate oxide leakage and delay for dual <i>T<sub>ox</sub></i> circuits
- Sultania, AK
- Sylvester, D
- Sapatnekar, SS
ISSN: 0738-100X
ISBN: 1-58113-828-8
Ano de publicación: 2004
Páxinas: 761-766
Congreso: 41st Design Automation Conference
Tipo: Achega congreso
