Ibon
Ocaña Arizcorreta
Investigador Principal
Javier
Gil Sevillano
Publikationen, an denen er mitarbeitet Javier Gil Sevillano (11)
2007
-
Adhesion studies in integrated circuit interconnect structures
Engineering Failure Analysis, Vol. 14, Núm. 2, pp. 349-354
2006
-
Adhesion studies in low-k interconnects using cross sectional nanoindentation
AIP Conference Proceedings
-
Fracture characterization in patterned thin films by cross-sectional nanoindentation
Acta Materialia, Vol. 54, Núm. 13, pp. 3453-3462
-
Simulation of cross-sectional nanoindentation in interconnect structures with cohesive elements
Fracture of Nano and Engineering Materials and Structures - Proceedings of the 16th European Conference of Fracture
-
Use of nanoindentation to characterise the plasma damage region in low-k dielectric films
American Society of Mechanical Engineers, Applied Mechanics Division, AMD
-
Use of nanoindentation to characterise the plasma damage region in low-k dielectric films
American Society of Mechanical Engineers, Applied Mechanics Division, AMD
2005
-
A new technique for the characterization of the adhesion in integrated circuit interconnect structures
Materials Research Society Symposium Proceedings
-
A new technique for the characterization of the adhesion in integrated circuit interconnect structures
11th International Conference on Fracture 2005, ICF11
1997
-
Two mechanical size effects of technical interest: A simple approach
Journal De Physique. IV : JP, Vol. 8, Núm. 4
1994
-
Modelling cleavage fracture of bainitic steels
Acta Metallurgica Et Materialia, Vol. 42, Núm. 6, pp. 2057-2068
1993
-
How a stable crack extension changes the Weibull modulus of cleavage fracture probability
International Journal of Fracture, Vol. 62, Núm. 2