Reyes
Elizalde González
Investigadora Principal
IK4-Lortek
Ordizia, EspañaPublikationen in Zusammenarbeit mit Forschern von IK4-Lortek (3)
2017
2016
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X-ray asterism and the structure of cracks from indentations in silicon
Journal of Applied Crystallography, Vol. 49, pp. 250-259
2015
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The geometry of catastrophic fracture during high temperature processing of silicon
International Journal of Fracture, Vol. 195, Núm. 1-2, pp. 79-85