Dislocation sources and slip band nucleation from indents on silicon wafers

  1. Wittge, J.
  2. Danilewsky, A.N.
  3. Allen, D.
  4. McNally, P.
  5. Li, Z.
  6. Baumbach, T.
  7. Gorostegui-Colinas, E.
  8. Garagorri, J.
  9. Elizalde, M.R.
  10. Jacques, D.
  11. Fossati, M.C.
  12. Bowen, D.K.
  13. Tanner, B.K.
Aldizkaria:
Journal of Applied Crystallography

ISSN: 0021-8898 1600-5767

Argitalpen urtea: 2010

Alea: 43

Zenbakia: 5 PART 1

Orrialdeak: 1036-1039

Mota: Artikulua

DOI: 10.1107/S0021889810029894 GOOGLE SCHOLAR