Circuit Performance Shifts Due to Layout-Dependent Stress in Planar and 3D-ICs

  1. Marella, S.K.
  2. Sapatnekar, S.S.
Aldizkaria:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems

ISSN: 1063-8210

Argitalpen urtea: 2018

Alea: 26

Zenbakia: 12

Orrialdeak: 2907-2920

Mota: Artikulua

DOI: 10.1109/TVLSI.2018.2866290 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus