Estimating Circuit Aging Due to BTI and HCI Using Ring-Oscillator-Based Sensors

  1. Sengupta, D.
  2. Sapatnekar, S.S.
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

ISSN: 0278-0070

Year of publication: 2017

Volume: 36

Issue: 10

Pages: 1688-1701

Type: Article

DOI: 10.1109/TCAD.2017.2648840 GOOGLE SCHOLAR lock_openOpen access editor

Sustainable development goals

Data source: Scopus