Probabilistic wire resistance degradation due to electromigration in power grids

  1. Mishra, V.
  2. Sapatnekar, S.S.
Zeitschrift:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

ISSN: 0278-0070

Datum der Publikation: 2017

Ausgabe: 36

Nummer: 4

Seiten: 628-640

Art: Artikel

DOI: 10.1109/TCAD.2016.2584054 GOOGLE SCHOLAR lock_openOpen Access editor
Datenquelle: Scopus