Probabilistic wire resistance degradation due to electromigration in power grids

  1. Mishra, V.
  2. Sapatnekar, S.S.
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

ISSN: 0278-0070

Year of publication: 2017

Volume: 36

Issue: 4

Pages: 628-640

Type: Article

DOI: 10.1109/TCAD.2016.2584054 GOOGLE SCHOLAR lock_openOpen access editor