Probabilistic wire resistance degradation due to electromigration in power grids
- Mishra, V.
- Sapatnekar, S.S.
ISSN: 0278-0070
Argitalpen urtea: 2017
Alea: 36
Zenbakia: 4
Orrialdeak: 628-640
Mota: Artikulua
Aldizkaria:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
