The impact of BTI variations on timing in digital logic circuits

  1. Fang, J.
  2. Sapatnekar, S.S.
Journal:
IEEE Transactions on Device and Materials Reliability

ISSN: 1530-4388,  1558-2574

Year of publication: 2013

Volume: 13

Issue: 1

Pages: 277-286

Type: Article

DOI: 10.1109/TDMR.2013.2237910 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus