Process and reliability sensors for Nanoscale CMOS

  1. Keane, J.P.
  2. Kim, C.H.
  3. Liu, Q.
  4. Sapatnekar, S.S.
Journal:
IEEE Design and Test of Computers

ISSN: 0740-7475

Year of publication: 2012

Volume: 29

Issue: 5

Pages: 8-17

Type: Article

DOI: 10.1109/MDT.2012.2211561 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus