Scalable methods for analyzing the circuit failure probability due to gate oxide breakdown

  1. Fang, J.
  2. Sapatnekar, S.S.
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems

ISSN: 1063-8210

Year of publication: 2012

Volume: 20

Issue: 11

Pages: 1960-1973

Type: Article

DOI: 10.1109/TVLSI.2011.2166568 GOOGLE SCHOLAR
Data source: Scopus