A framework for scalable postsilicon statistical delay prediction under process variations

  1. Liu, Q.
  2. Sapatnekar, S.S.
Aldizkaria:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

ISSN: 0278-0070

Argitalpen urtea: 2009

Alea: 28

Zenbakia: 1

Orrialdeak: 1201-1212

Mota: Artikulua

GOOGLE SCHOLAR
Datuen iturria: Scopus