A framework for scalable postsilicon statistical delay prediction under process variations

  1. Liu, Q.
  2. Sapatnekar, S.S.
Revue:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

ISSN: 0278-0070

Année de publication: 2009

Volumen: 28

Número: 1

Pages: 1201-1212

Type: Article

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La source de données: Scopus