An Ensemble of Component-Based and Population-Based Self-Organizing Maps for the Identification of the Degradation State of Insulated-Gate Bipolar Transistors
- Rigamonti, M.
- Baraldi, P.
- Alessi, A.
- Zio, E.
- Astigarraga, D.
- Galarza, A.
ISSN: 0018-9529
Year of publication: 2018
Volume: 67
Issue: 3
Pages: 1304-1313
Type: Article