A comparison among different setups for measuring on-wafer integrated inductors in RF applications

  1. Aguilera, J.
  2. Matías, G.
  3. De Nó, J.
  4. García-Alonso, A.
  5. Berenguer, R.
Journal:
IEEE Transactions on Instrumentation and Measurement

ISSN: 0018-9456

Year of publication: 2002

Volume: 51

Issue: 3

Pages: 487-491

Type: Article

DOI: 10.1109/TIM.2002.1017719 GOOGLE SCHOLAR
Data source: Scopus