A comparison among different setups for measuring on-wafer integrated inductors in RF applications

  1. Aguilera, J.
  2. Matías, G.
  3. De Nó, J.
  4. García-Alonso, A.
  5. Berenguer, R.
Aldizkaria:
IEEE Transactions on Instrumentation and Measurement

ISSN: 0018-9456

Argitalpen urtea: 2002

Alea: 51

Zenbakia: 3

Orrialdeak: 487-491

Mota: Artikulua

DOI: 10.1109/TIM.2002.1017719 GOOGLE SCHOLAR
Datuen iturria: Scopus