A comparison among different setups for measuring on-wafer integrated inductors in RF applications

  1. Aguilera, J.
  2. Matías, G.
  3. De Nó, J.
  4. García-Alonso, A.
  5. Berenguer, R.
Revue:
IEEE Transactions on Instrumentation and Measurement

ISSN: 0018-9456

Année de publication: 2002

Volumen: 51

Número: 3

Pages: 487-491

Type: Article

DOI: 10.1109/TIM.2002.1017719 GOOGLE SCHOLAR
La source de données: Scopus