Fast and accurate statistical criticality computation under process variations
- Mogal, H.D.
- Qian, H.
- Sapatnekar, S.S.
- Bazargan, K.
ISSN: 0278-0070
Year of publication: 2009
Volume: 28
Issue: 3
Pages: 350-363
Type: Article
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems