Fast and accurate statistical criticality computation under process variations

  1. Mogal, H.D.
  2. Qian, H.
  3. Sapatnekar, S.S.
  4. Bazargan, K.
Revue:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

ISSN: 0278-0070

Année de publication: 2009

Volumen: 28

Número: 3

Pages: 350-363

Type: Article

DOI: 10.1109/TCAD.2009.2013278 GOOGLE SCHOLAR
La source de données: Scopus