Fast and accurate statistical criticality computation under process variations

  1. Mogal, H.D.
  2. Qian, H.
  3. Sapatnekar, S.S.
  4. Bazargan, K.
Aldizkaria:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

ISSN: 0278-0070

Argitalpen urtea: 2009

Alea: 28

Zenbakia: 3

Orrialdeak: 350-363

Mota: Artikulua

DOI: 10.1109/TCAD.2009.2013278 GOOGLE SCHOLAR
Datuen iturria: Scopus