Confidence scalable post-silicon statistical delay prediction under process variations
- Qunzeng, L.
- Sapatnekar, S.S.
ISSN: 0738-100X
ISBN: 9781595936271
Year of publication: 2007
Pages: 497-502
Type: Conference paper
ISSN: 0738-100X
ISBN: 9781595936271
Year of publication: 2007
Pages: 497-502
Type: Conference paper