Confidence scalable post-silicon statistical delay prediction under process variations
- Qunzeng, L.
- Sapatnekar, S.S.
ISSN: 0738-100X
ISBN: 9781595936271
Argitalpen urtea: 2007
Orrialdeak: 497-502
Mota: Biltzar ekarpena
Aktak:
Proceedings - Design Automation Conference