Publicaciones en colaboración con investigadores/as de Karlsruhe Institute of Technology (7)

2013

  1. Crack propagation and fracture in silicon wafers under thermal stress

    Journal of Applied Crystallography, Vol. 46, Núm. 4, pp. 849-855

  2. X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers

    Powder Diffraction

2011

  1. Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging

    Journal of Crystal Growth

  2. Real-time X-ray diffraction imaging for semiconductor wafer metrology and high temperature in situ experiments

    Physica Status Solidi (A) Applications and Materials Science, Vol. 208, Núm. 11, pp. 2499-2504

2010

  1. Dislocation generation related to micro-cracks in Si wafers: High temperature in situ study with white beam X-ray topography

    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 268, Núm. 3-4, pp. 399-402

  2. Dislocation sources and slip band nucleation from indents on silicon wafers

    Journal of Applied Crystallography, Vol. 43, Núm. 5 PART 1, pp. 1036-1039

  3. X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers

    Powder Diffraction, Vol. 25, Núm. 2, pp. 99-103