Analysis of the Results of Accelerated Aging Tests in Insulated Gate Bipolar Transistors

  1. Astigarraga, D.
  2. Ibanez, F.M.
  3. Galarza, A.
  4. Echeverria, J.M.
  5. Unanue, I.
  6. Baraldi, P.
  7. Zio, E.
Journal:
IEEE Transactions on Power Electronics

ISSN: 0885-8993

Year of publication: 2016

Volume: 31

Issue: 11

Pages: 7953-7962

Type: Article

DOI: 10.1109/TPEL.2015.2512923 GOOGLE SCHOLAR
Data source: Scopus