Analysis of the Results of Accelerated Aging Tests in Insulated Gate Bipolar Transistors

  1. Astigarraga, D.
  2. Ibanez, F.M.
  3. Galarza, A.
  4. Echeverria, J.M.
  5. Unanue, I.
  6. Baraldi, P.
  7. Zio, E.
Aldizkaria:
IEEE Transactions on Power Electronics

ISSN: 0885-8993

Argitalpen urtea: 2016

Alea: 31

Zenbakia: 11

Orrialdeak: 7953-7962

Mota: Artikulua

DOI: 10.1109/TPEL.2015.2512923 GOOGLE SCHOLAR
Datuen iturria: Scopus