Thermal slip sources at the extremity and bevel edge of silicon wafers
- Tanner, B.K.
- Wittge, J.
- Allen, D.
- Fossati, M.C.
- Danilwesky, A.N.
- McNally, P.
- Garagorri, J.
- Elizalde, M.R.
- Jacques, D.
ISSN: 0021-8898, 1600-5767
Year of publication: 2011
Volume: 44
Issue: 3
Pages: 489-494
Type: Article