Thermal slip sources at the extremity and bevel edge of silicon wafers

  1. Tanner, B.K.
  2. Wittge, J.
  3. Allen, D.
  4. Fossati, M.C.
  5. Danilwesky, A.N.
  6. McNally, P.
  7. Garagorri, J.
  8. Elizalde, M.R.
  9. Jacques, D.
Aldizkaria:
Journal of Applied Crystallography

ISSN: 0021-8898 1600-5767

Argitalpen urtea: 2011

Alea: 44

Zenbakia: 3

Orrialdeak: 489-494

Mota: Artikulua

DOI: 10.1107/S0021889811012088 GOOGLE SCHOLAR