Capturing post-silicon variations using a representative critical path

  1. Liu, Q.
  2. Sapatnekar, S.S.
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

ISSN: 0278-0070

Year of publication: 2010

Volume: 29

Issue: 2

Pages: 211-222

Type: Conference paper

DOI: 10.1109/TCAD.2009.2035552 GOOGLE SCHOLAR
Data source: Scopus