Statistical leakage estimation of double gate FinFET devices considering the width quantization property

  1. Gu, J.
  2. Keane, J.
  3. Sapatnekar, S.
  4. Kim, C.H.
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems

ISSN: 1063-8210

Year of publication: 2008

Volume: 16

Issue: 2

Pages: 206-209

Type: Article

DOI: 10.1109/TVLSI.2007.909809 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus