Statistical leakage estimation of double gate FinFET devices considering the width quantization property
- Gu, J.
- Keane, J.
- Sapatnekar, S.
- Kim, C.H.
ISSN: 1063-8210
Année de publication: 2008
Volumen: 16
Número: 2
Pages: 206-209
Type: Article
ISSN: 1063-8210
Année de publication: 2008
Volumen: 16
Número: 2
Pages: 206-209
Type: Article