In situ observations of dc and ac electromigration in passivated Al lines

  1. Castaño, E.
  2. Maiz, J.
  3. Flinn, P.
  4. Madden, M.
Journal:
Applied Physics Letters

ISSN: 0003-6951

Year of publication: 1991

Volume: 59

Issue: 1

Pages: 129-131

Type: Article

DOI: 10.1063/1.105551 GOOGLE SCHOLAR lock_openOpen access editor
Data source: Scopus