Publicaciones en colaboración con investigadores/as de University of Freiburg (13)

2017

  1. Quantitative imaging of the stress/strain fields and generation of macroscopic cracks from indents in silicon

    Crystals, Vol. 7, Núm. 11

2016

  1. X-ray asterism and the structure of cracks from indentations in silicon

    Journal of Applied Crystallography, Vol. 49, pp. 250-259

2015

  1. The geometry of catastrophic fracture during high temperature processing of silicon

    International Journal of Fracture, Vol. 195, Núm. 1-2, pp. 79-85

2013

  1. Crack propagation and fracture in silicon wafers under thermal stress

    Journal of Applied Crystallography, Vol. 46, Núm. 4, pp. 849-855

  2. X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers

    Powder Diffraction

2012

  1. Prediction of the propagation probability of individual cracks in brittle single crystal materials

    Applied Physics Letters, Vol. 101, Núm. 4

2011

  1. Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging

    Journal of Crystal Growth

  2. Real-time X-ray diffraction imaging for semiconductor wafer metrology and high temperature in situ experiments

    Physica Status Solidi (A) Applications and Materials Science, Vol. 208, Núm. 11, pp. 2499-2504

  3. Thermal slip sources at the extremity and bevel edge of silicon wafers

    Journal of Applied Crystallography, Vol. 44, Núm. 3, pp. 489-494

2010

  1. Dislocation generation related to micro-cracks in Si wafers: High temperature in situ study with white beam X-ray topography

    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 268, Núm. 3-4, pp. 399-402

  2. Dislocation sources and slip band nucleation from indents on silicon wafers

    Journal of Applied Crystallography, Vol. 43, Núm. 5 PART 1, pp. 1036-1039

  3. Observation of nano-indent induced strain fields and dislocation generation in silicon wafers using micro-Raman spectroscopy and white beam X-ray topography

    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 268, Núm. 3-4, pp. 383-387

  4. X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers

    Powder Diffraction, Vol. 25, Núm. 2, pp. 99-103